En Naciri, A. : rechercher sur Z-Library

Broch, Laurent, Stein, Nicolas, Zimmer, Alexandre, Battie, Yann, Naciri, Aotmane En

Année:

2011

Langue:

english

Fichier:

PDF, 140 KB

english, 2011

Design of a real-time spectroscopic rotating compensator ellipsometer without systematic errors

Journal:

Journal of Materials Chemistry C

Année:

2014

Langue:

english

Fichier:

PDF, 820 KB

english, 2014

One-step synthesis of a monolayer of monodisperse gold nanocubes for SERS substrates

Omar, Rana, En Naciri, Aotmane, Jradi, Safi, Battie, Y., Toufaily, Joumana, Mortada, Hussein, Akil, Suzanna

Journal:

Année:

2017

Langue:

english

Fichier:

PDF, 1.86 MB

english, 2017

Dielectric functions of PECVD-grown silicon nanoscale inclusions within rapid thermal annealed silicon-rich silicon nitride films

A.-S. Keita, A. En Naciri, F. Delachat, M. Carrada, G. Ferblantier, A. Slaoui, M. Stchakovsky

Journal:

Année:

2011

Langue:

english

Fichier:

PDF, 769 KB

english, 2011

Optical properties of ZnTe and ZnS nanocrystals by critical-points and Tauc–Lorentz models

A. En Naciri, F. Ahmed, M. Stchakovsky

Journal:

Gilliot, Mickaël, En Naciri, Aotmane

Année:

2011

Langue:

english

Fichier:

PDF, 903 KB

english, 2011

Theory of dual-rotating polarizer and analyzer ellipsometer

Journal:

Année:

2013

Langue:

english

Fichier:

PDF, 287 KB

english, 2013

Confinement in single walled carbon nanotubes investigated by spectroscopic ellipsometry

Battie, Y., Jamon, D., Lauret, J.S., Gu, Q., Gicquel-Guézo, M., En Naciri, A., Loiseau, A.

Journal:

Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy

Année:

2014

Langue:

english

Fichier:

PDF, 1.14 MB

english, 2014

Microstructure and optical dispersion characterization of nanocomposite sol–gel TiO2–SiO2 thin films with different compositions

Kermadi, S., Agoudjil, N., Sali, S., Zougar, L., Boumaour, M., Broch, L., En Naciri, A., Placido, F.

Journal:

Année:

2015

Langue:

english

Fichier:

PDF, 3.67 MB

english, 2015

SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California (Saturday 22 January 2011)] Oxide-based Materials and Devices II - Application of dilute boron B(Al,In,Ga)N alloys for UV light sources

Gautier, S., Abid, M., Moudakir, T., Orsal, G., En Naciri, A., Pantzas, K., Jomard, F., Voss, P. L., Rogers, D. J., Teherani, F. Hosseini, Ougazzaden, A., Teherani, Ferechteh H., Look, David C., Roger

Année:

2011

Langue:

english

Fichier:

PDF, 1.05 MB

english, 2011

Influence of the laser light absorption by the colloid on the properties of silver nanoparticles produced by laser ablation in stirred and stationary liquid

Resano-Garcia, A., Battie, Y., Koch, A., En Naciri, A., Chaoui, N.

Journal:

Journal of Applied Physics

Année:

2015

Langue:

english

Fichier:

PDF, 2.38 MB

english, 2015

Gold Nanoparticle Chains: Synthesis, Characterization, and Modeling Using Spectroscopic Ellipsometry

Vieaud, Julien, Gao, Jie, Cane, Jérémy, Stchakovsky, Michel, En Naciri, Aotmane, Ariga, Katsuhiko, Oda, Reiko, Pouget, Emilie, Battie, Yann

Journal:

The Journal of Physical Chemistry C

Année:

2018

Langue:

english

Fichier:

PDF, 1.52 MB

english, 2018

Determination of Complex Optical Constants of Uniaxial HgI2 by Spectroscopic Conventional and Generalized Ellipsometry

A. En Naciri, L. Johann, R. Kleim, M. Sieskind, M. Amann

Journal:

Journal of Crystal Growth

Année:

1999

Langue:

english

Fichier:

PDF, 233 KB

english, 1999

Application of spectroscopic ellipsometry to the investigation of the optical properties of cobalt-nanostructured silica thin layers

M. Gilliot, A. En Naciri, L. Johann, C. d’Orleans, D. Muller, J.P. Stoquert, J.J. Grob

Journal:

Applied Surface Science

Année:

2006

Langue:

english

Fichier:

PDF, 576 KB

english, 2006

Blue–violet boron-based Distributed Bragg Reflectors for VCSEL application

M. Abid, T. Moudakir, Z. Djebbour, G. Orsal, S. Gautier, A. En Naciri, A. Migan-Dubois, A. Ougazzaden

Journal:

Année:

2011

Langue:

english

Fichier:

PDF, 1.50 MB

english, 2011

Dielectric function of germanium nanocrystals between 0.6 and 6.5 eV by spectroscopic ellipsometry

M. Mansour, A. En Naciri, L. Johann, S. Duguay, J.J. Grob, M. Stchakovsky, C. Eypert

Journal:

Journal of Physics and Chemistry of Solids

Année:

2006

Langue:

english

Fichier:

PDF, 222 KB

english, 2006

Optical study of cobalt nanocrystals implanted into silica matrix by spectroscopic ellipsometry

M. Gilliot, A. En Naciri, L. Johann, C. d’Orleans, D. Muller, J.P. Stoquert, J.J. Grob

Journal:

Superlattices and Microstructures

Année:

2004

Langue:

english

Fichier:

PDF, 431 KB

english, 2004

Spectroscopic ellipsometric characterization of approximant thin films of Al–Cr–Fe

L. Johann, A. En Naciri, L. Broch, V. Demange, J. Ghambaja, F. Machizaud, J.M. Dubois

Journal:

Applied Surface Science

Année:

2003

Langue:

english

Fichier:

PDF, 179 KB

english, 2003

Spectroscopic ellipsometry studies of HgI2 surface roughness effects and optical properties of [KHgI3, H2O]

A. En Naciri, L. Johann, L. Broch, M. Sieskind, M. Amann

Journal:

Surface and Coatings Technology

Année:

2002

Langue:

english

Fichier:

PDF, 164 KB

english, 2002

Conventional and generalized ellipsometric investigation of isotropic spherical and anisotropic ellipsoidal cobalt nanoparticles

M. Gilliot, A. En Naciri, L. Johann, J. P. Stoquert, J. J. Grob, D. Muller

Journal:

Année:

2008

Langue:

english

Fichier:

PDF, 773 KB

english, 2008

Dielectric function and optical transitions of silicon nanocrystals between 0.6 eV and 6.5 eV

M. Mansour, A. En Naciri, L. Johann, J. J. Grob, M. Stchakovsky

Journal:

Année:

2008

Langue:

english

Fichier:

PDF, 1.39 MB

english, 2008

Optical properties of embedded ZnTe nanocrystals in SiO2 thin layer

F. Ahmed, A. En Naciri, J. J. Grob

Journal:

physica status solidi (c)

Année:

2010

Langue:

english

Fichier:

PDF, 575 KB

english, 2010

Dielectric functions of Si nanoparticles within a silicon nitride matrix

A.-S. Keita, A. En Naciri, F. Delachat, M. Carrada, G. Ferblantier, A. Slaoui

Journal:

Année:

2010

Langue:

english

Fichier:

PDF, 267 KB

english, 2010

Optical properties of ZnS:Mn nanocrystals

F. Ahmed, A. En Naciri, J. J. Grob

Journal:

physica status solidi (c)

Année:

2010

Langue:

english

Fichier:

PDF, 330 KB

english, 2010

Fixed polarizer, rotating-polarizer and fixed analyzer spectroscopic ellipsometer: accurate calibration method, effect of errors and testing

A. En Naciri, L. Broch, L. Johann, R. Kleim

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Année:

2002

Langue:

english

Fichier:

PDF, 317 KB

english, 2002

Optical anisotropy of single walled carbon nanotubes investigated by spectroscopic ellipsometry

Y. Battie, D. Jamon, J.-S. Lauret, A. En Naciri, L. Broch, A. Loiseau

Journal:

Carbon

Année:

2012

Langue:

english

Fichier:

PDF, 869 KB

english, 2012

Optical study of Si nanocrystals in Si/SiO2 layers by spectroscopic ellipsometry

A. En Naciri, M. Mansour, L. Johann, J.J. Grob, C. Eckert

Journal:

Année:

2004

Langue:

english

Fichier:

PDF, 348 KB

english, 2004

Accurate calibration and optimized measurement: use of an achromatic compensator in rotating polarizer spectroscopic ellipsometry

L. Broch, A. En Naciri, L. Johann

Journal:

Année:

2004

Langue:

english

Fichier:

PDF, 565 KB

english, 2004

Correlation between silicon nanocrystalline size effect and spectroscopic ellipsometry responses

A. En Naciri, M. Mansour, L. Johann, J.J. Grob, C. Eckert

Journal:

Année:

2004

Langue:

english

Fichier:

PDF, 146 KB

english, 2004

Spectroscopic ellipsometry characterization of ZnO–In2O3 systems

H. El Rhaleb, A. En Naciri, R. Dounia, L. Johann, A. Hakam, M. Addou

Journal:

En Naciri, Aotmane, Johann, Luc, Kleim, Roland, Sieskind, Manuel, Amann, Marianne

Année:

2004

Langue:

english

Fichier:

PDF, 291 KB

english, 2004

Spectroscopic Ellipsometry of Anisotropic Materials: Application to the Optical Constants of HgI_2

Journal:

En Naciri, Aotmane, Johann, Luc, Kleim, Roland

Année:

1999

Langue:

english

Fichier:

PDF, 164 KB

english, 1999

Spectroscopic Generalized Ellipsometry Based on Fourier Analysis

Journal:

Johann, Luc, Kleim, Roland, Sieskind, Manuel, Amann, Marianne, En Naciri, Aotmane

Année:

1999

Langue:

english

Fichier:

PDF, 209 KB

english, 1999

Surface Effects of the HgI2 Crystal Characterized by Spectroscopic Ellipsometry

Journal:

Broch, Laurent, En Naciri, Aotmane, Johann, Luc

Année:

2001

Langue:

english

Fichier:

PDF, 140 KB

english, 2001

Second-order systematic errors in Mueller matrix dual rotating compensator ellipsometry

Journal: